Magnetic force microscopy
نویسندگان
چکیده
The remarkable outbreak of nanotechnologies and among these of nanobiotechnologies has been allowed by the invention, development, continuous improvement of different techniques and instrumentations for the imaging of materials and systems at the nanoscale. Among such techniques, atomic force microscopy (AFM) represents a well established technique for the imaging of a wide range of samples as it requires minimal sample preparation and allows one to image the samples in air, liquid environment, or vacuum. In AFM, the sample is imaged by scanning it using a sharp tip placed at the end of a micromachined cantilever, the deflection of which is monitored through an optical lever system. The sample morphology can be reconstructed by recording the cantilever deflection during the scanning (contact mode) and in this case the interaction between the tip and the sample surface is continuous during the scanning. In order to reduce the tip-sample interaction time and thus the possibility of damaging the sample and contaminating the tip, which are serious limitations when imaging soft samples like polymers or biological materials, the sample morphology can be reconstructed also by monitoring the oscillation amplitude of the cantilever set into vibration. In this second case, the tip-sample interaction is limited to a fraction of the period of oscillation of the cantilever (intermittent contact or tapping mode). The unique possibility of ‘touching’ instead that ‘seeing’ the surface offered by AFM has stimulated the development of a wide number of techniques for the characterization of different functional properties beyond the topographical reconstruction. Indeed, force spectroscopy, qualitative imaging, and quantitative mapping can be performed to characterize mechanical, electric, electromechanical, magnetic, chemical, thermal properties surfaces and materials with nanometrical lateral resolution. Among these techniques, magnetic force microscopy (MFM) has been proposed for the imaging of magnetic domains at the nanoscale. Although the
منابع مشابه
Magnetic force microscopy using fabricated cobalt-coated carbon nanotubes probes
Magnetic force microscope ( MFM ) is a powerful technique for mapping the magnetic force gradient above the sample surface. Herein, single-wall carbon nanotubes (SWCNT) were used to fabricate MFM probe by dielectrophoresis method which is a reproducible and cost-effective technique. The effect of induced voltage on the deposition manner of carbon nanotubes (CNT) on the atomic force microscope (...
متن کاملMagnetic Force Microscopy in Liquids.
In this work, the use of magnetic force microscopy (MFM) to acquire images of magnetic nanostructures in liquid environments is presented. Optimization of the MFM signal acquisition in liquid media is performed and it is applied to characterize the magnetic signal of magnetite nanoparticles. The ability for detecting magnetic nanostructures along with the well-known capabilities of atomic force...
متن کاملQuantitative Measurement of the Magnetic Moment of Individual Magnetic Nanoparticles by Magnetic Force Microscopy
The quantitative measurement of the magnetization of individual magnetic nanoparticles (MNPs) using magnetic force microscopy (MFM) is described. Quantitative measurement is realized by calibration of the MFM signal using an MNP reference sample with traceably determined magnetization. A resolution of the magnetic moment of the order of 10(-18) A m(2) under ambient conditions is demonstrated, w...
متن کاملImaging using Magnetic Resonance Force Microscopy
We demonstrate one-dimensional nuclear magnetic resonance imaging of the semiconductor GaAs with 170 nanometer slice separation and resolve two regions of reduced nuclear spin polarization density separated by only 500 nanometers. This is achieved by force detection of the magnetic resonance, Magnetic Resonance Force Microscopy (MRFM), in combination with optical pumping to increase the nuclear...
متن کاملAN INVESTIGATION ON THE EFFECT OF ELECTROMAGNETIC FORCE ON THE CHARACTERISTICS OF ELECTRODEPOSITED Ni/Al2O3 COMPOSITE COATINGS
Electrochemical coating processes are significantly affected by applied magnetic fields due to the generation of electromagnetic forces. The present research work has been undertaken to study the effect of coating parameters such as current density and alumina concentration on the characteristics of Ni-Al2O3 composite coating under static magnetic field. Ni-Al2O3 composite coating was applied o...
متن کاملAtomic Force Microscopy Application in Biological Research: A Review Study
Atomic force microscopy (AFM) is a three-dimensional topographic technique with a high atomic resolution to measure surface roughness. AFM is a kind of scanning probe microscope, and its near-field technique is based on the interaction between a sharp tip and the atoms of the sample surface. There are several methods and many ways to modify the tip of the AFM to investigate surface properties, ...
متن کامل